Please use this identifier to cite or link to this item: http://sci.ldubgd.edu.ua:8080/jspui/handle/123456789/1241
Title: Thermally-induced electronic relaxation in structurally-modified Cu0.1Ni0.8Co0.2Mn1.9O4 spinel ceramics
Authors: Shpotyuk, O.
Valitska, V.
Brunner, M.
Hadzaman, I.
Klym, H.
Keywords: Ceramics
Electrical resistance
Stretched exponential relaxation
Issue Date: 2015
Publisher: Physica B, v. 459 (2015) 116–121.
Abstract: Thermally-induced electronic relaxation in structurally-modified Cu0.1Ni0.8Co0.2Mn1.9O4 spinel ceramics is shown to be adequately described by stretched exponential function on time. This kinetics is defined by microsctructure perfectness of the relaxing media, showing obvious onset to stretched exponential behaviour with non-exponentionality index attaining close to 0.43 values for high-monolith ceramics and smaller ones in fine-grained ceramics. Percolation threshold in relaxation-degradation kinetics is detected for ceramics with 10% of NiO extractions, showing the smallest but most prolonged single-path degradation effect. This finding is treated in terms of Phillips’ axiomatic diffusion-to-trap model, where only one of two relaxation channels (caused by operative short-range forces) occurs to be effective, while additional non-operative channels contribute to electronic relaxation in fine-grained ceramics
Description: The character of thermally-induced electronic degradation in structurally-modified spinel Cu0.1Ni0.8Co0.2Mn1.9O4 ceramics is defined by microsctructure perfectness of the relaxing media, showing obvious onset to stretched exponential behaviour with non-exponentionality index attaining close to 3/7 ¼ 0.43 values for high-monolith ceramics. This tendency is explained within Phil- lips' axiomatic diffusion-to-trap model as activation of only one of two operative channels effective for relaxation. The percolation threshold in the observed relaxation-degradation kinetics is de- tected to be in the ceramics with 10% of NiO extractions, showing the smallest but most prolonged single-path degradation effect
URI: http://hdl.handle.net/123456789/1241
Appears in Collections:2015

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